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Equipment Pascal Co., Ltd

Compact Laser MBE System
INDUSTRIAL

Оборудования для эпитаксиального выращивания полупроводниковых гетероструктур методом молекулярно-лучевой эпитаксии (импульсная лазерная абляция и т.д.).

Time of Flight Low Energy Atom Scattering Spectroscopy
INDUSTRIAL

The low energy ion scattering spectroscopy (LEIS) is a powerful method for surface crystal structure and elemental composition analysis of then topmost several layers of the crystal surface, including insulator surfaces.

© 2012—2023, Japan Machinery Company
Tokyo, Japan
JMC Bldg., 4th Floor
2-19-6 Higashirokugo Ota-Ku, Tokyo, 144-0046,
Japan
Phone: (81)-3-4500-6508
Fax: (81)-3-3730-3781

Moscow, Russia
Business Center «Na Leningradke», office.3
Moscow, Leningradskoe shosse 29,
125212, Russia
Tel: +(7) 499-678-23-18
Fax: +(7) 985-767-01-11
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